Secondary electron emission from surface channeled protons at a KCl() surface
نویسندگان
چکیده
منابع مشابه
Calculation of Secondary Electron Emission Yield From MgO Surface
Secondary electron emission yield values for rare-gas particles (He, Ne, Ar, Kr, and Xe ions of atoms and molecules, metastable atoms, and excimers) of MgO deposited under optimum conditions for the highest values were calculated assuming the Auger transitions between the valence band, and the (oxygen ion vacancy + two electrons) and + (oxygen ion vacancy + one electron) centers in the MgO surf...
متن کاملFirst-principles study on secondary electron emission of MgO surface
We theoretically investigate secondary-electron-emission properties of MgO when noble gases are incident on the surface. We consider both potential and kinetic emission mechanisms. For the potential emission through Auger neutralization, densities of states and vacuum level are obtained from the first-principles calculations. It is found that secondary-emission coefficients decrease in the foll...
متن کاملSecondary-electron emission by 0.5-MeVÕu H, He, and Li ions specularly reflected from a SnTe„001... surface: Possibility of the surface track potential reducing the secondary-electron yield at a semiconductor surface
Secondary-electron emission by 0.5-MeV/u H, He, and Li ions specularly reflected from a SnTe(001) surface: Possibility of the surface track potential reducing the secondary-electron yield at a semiconductor surface Author(s) Kimura, K; Usui, S; Nakajima, K Citation PHYSICAL REVIEW A (2000), 62(6) Issue Date 2000-12 URL http://hdl.handle.net/2433/39820 Right Copyright 2000 American Physical Soci...
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The electron field emission properties of tetrahedral amorphous carbon thin films deposited using a filtered cathodic vacuum arc system have improved as a result of surface treatment with H, O, and Ar ions. The limiting factor of the emission process does not appear to be only the front surface of the films. The improvement in the emission after ion beam treatment appears to be independent of t...
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ژورنال
عنوان ژورنال: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
سال: 2000
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(99)00572-8